Ban, T., & Junior, G. G. S. Critical Gates Identification for Fault-Tolerant Design in Math Circuits. Wiley.
Chicago Style (17th ed.) CitationBan, Tian, and Gutemberg G. S. Junior. Critical Gates Identification for Fault-Tolerant Design in Math Circuits. Wiley.
MLA (9th ed.) CitationBan, Tian, and Gutemberg G. S. Junior. Critical Gates Identification for Fault-Tolerant Design in Math Circuits. Wiley.
Warning: These citations may not always be 100% accurate.