High‐speed serializer timing‐error detection circuit with enhanced verification reliability through floating state prevention

Abstract This article presents a serializer (SER) timing‐error detection circuit that enhances the verification reliability of high‐speed wireline interfaces. A timing mismatch in the SER leads to bit errors during data transmission. To detect the timing error, the proposed design employs a set‐rese...

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Main Authors: Jongchan Lee, Joo‐Hyung Chae
Format: Article
Language:English
Published: Wiley 2024-12-01
Series:Electronics Letters
Subjects:
Online Access:https://doi.org/10.1049/ell2.70121
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author Jongchan Lee
Joo‐Hyung Chae
author_facet Jongchan Lee
Joo‐Hyung Chae
author_sort Jongchan Lee
collection DOAJ
description Abstract This article presents a serializer (SER) timing‐error detection circuit that enhances the verification reliability of high‐speed wireline interfaces. A timing mismatch in the SER leads to bit errors during data transmission. To detect the timing error, the proposed design employs a set‐reset latch to self‐latch the detection result, improving the error detection accuracy, unlike the previously reported timing‐error detection design using a D flip‐flop. The prototype transmitter chip, fabricated using a 28‐nm CMOS process, was validated for accurate error detection across wide data rates ranging from 1.25 to 13 Gb/s, ensuring reliable high‐speed operation while efficiently handling timing mismatches across multiple SER stages.
format Article
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institution DOAJ
issn 0013-5194
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language English
publishDate 2024-12-01
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series Electronics Letters
spelling doaj-art-025aa532e8794a14b1fe333129ceca242025-08-20T02:39:11ZengWileyElectronics Letters0013-51941350-911X2024-12-016024n/an/a10.1049/ell2.70121High‐speed serializer timing‐error detection circuit with enhanced verification reliability through floating state preventionJongchan Lee0Joo‐Hyung Chae1Department of Electronics and Communications Engineering Kwangwoon University Seoul South KoreaDepartment of Electronics and Communications Engineering Kwangwoon University Seoul South KoreaAbstract This article presents a serializer (SER) timing‐error detection circuit that enhances the verification reliability of high‐speed wireline interfaces. A timing mismatch in the SER leads to bit errors during data transmission. To detect the timing error, the proposed design employs a set‐reset latch to self‐latch the detection result, improving the error detection accuracy, unlike the previously reported timing‐error detection design using a D flip‐flop. The prototype transmitter chip, fabricated using a 28‐nm CMOS process, was validated for accurate error detection across wide data rates ranging from 1.25 to 13 Gb/s, ensuring reliable high‐speed operation while efficiently handling timing mismatches across multiple SER stages.https://doi.org/10.1049/ell2.70121error detectionhigh‐speed integrated circuitstransmitters
spellingShingle Jongchan Lee
Joo‐Hyung Chae
High‐speed serializer timing‐error detection circuit with enhanced verification reliability through floating state prevention
Electronics Letters
error detection
high‐speed integrated circuits
transmitters
title High‐speed serializer timing‐error detection circuit with enhanced verification reliability through floating state prevention
title_full High‐speed serializer timing‐error detection circuit with enhanced verification reliability through floating state prevention
title_fullStr High‐speed serializer timing‐error detection circuit with enhanced verification reliability through floating state prevention
title_full_unstemmed High‐speed serializer timing‐error detection circuit with enhanced verification reliability through floating state prevention
title_short High‐speed serializer timing‐error detection circuit with enhanced verification reliability through floating state prevention
title_sort high speed serializer timing error detection circuit with enhanced verification reliability through floating state prevention
topic error detection
high‐speed integrated circuits
transmitters
url https://doi.org/10.1049/ell2.70121
work_keys_str_mv AT jongchanlee highspeedserializertimingerrordetectioncircuitwithenhancedverificationreliabilitythroughfloatingstateprevention
AT joohyungchae highspeedserializertimingerrordetectioncircuitwithenhancedverificationreliabilitythroughfloatingstateprevention