Lee, J., & Chae, J. High‐speed serializer timing‐error detection circuit with enhanced verification reliability through floating state prevention. Wiley.
Chicago Style (17th ed.) CitationLee, Jongchan, and Joo‐Hyung Chae. High‐speed Serializer Timing‐error Detection Circuit with Enhanced Verification Reliability Through Floating State Prevention. Wiley.
MLA (9th ed.) CitationLee, Jongchan, and Joo‐Hyung Chae. High‐speed Serializer Timing‐error Detection Circuit with Enhanced Verification Reliability Through Floating State Prevention. Wiley.
Warning: These citations may not always be 100% accurate.