Romanova, M., Chertopalov, S., Dekhtyar, Y., Fekete, L., Lančok, J., Novotný, M., . . . Vilken, A. Charge trapping in SiO2 substrate during electron beam deposition of CaF2 thin films of different thicknesses. Elsevier.
Chicago Style (17th ed.) CitationRomanova, Marina, et al. Charge Trapping in SiO2 Substrate During Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses. Elsevier.
MLA (9th ed.) CitationRomanova, Marina, et al. Charge Trapping in SiO2 Substrate During Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses. Elsevier.
Warning: These citations may not always be 100% accurate.