Yarn, K. F., Chien, W. C., & Wang, C. S. On the Reliability of Accelerated Testing in AIGaAs/InGaAs/GaAs PHEMTs. Wiley.
Chicago Style (17th ed.) CitationYarn, K. F., W. C. Chien, and C. S. Wang. On the Reliability of Accelerated Testing in AIGaAs/InGaAs/GaAs PHEMTs. Wiley.
MLA (9th ed.) CitationYarn, K. F., et al. On the Reliability of Accelerated Testing in AIGaAs/InGaAs/GaAs PHEMTs. Wiley.
Warning: These citations may not always be 100% accurate.