Xu, L., Wu, R., Lee, S. W., Xue, X., Peng, Y., Wang, Y., & Kim, H. S. Enhanced strength and electrical conductivity in pure copper via dynamic offsets and shear force adjustments cryorolling combining annealing. Elsevier.
Chicago Style (17th ed.) CitationXu, Longfei, Renhao Wu, Shi Woo Lee, Xin Xue, Yan Peng, Yuhui Wang, and Hyoung Seop Kim. Enhanced Strength and Electrical Conductivity in Pure Copper via Dynamic Offsets and Shear Force Adjustments Cryorolling Combining Annealing. Elsevier.
MLA (9th ed.) CitationXu, Longfei, et al. Enhanced Strength and Electrical Conductivity in Pure Copper via Dynamic Offsets and Shear Force Adjustments Cryorolling Combining Annealing. Elsevier.
Warning: These citations may not always be 100% accurate.