Model for Reliability Prediction of Thick Film Resistors
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| Main Authors: | D. S. Campbell, R. B. Pranchov |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
1984-01-01
|
| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/APEC.11.185 |
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