Model for Reliability Prediction of Thick Film Resistors

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Bibliographic Details
Main Authors: D. S. Campbell, R. B. Pranchov
Format: Article
Language:English
Published: Wiley 1984-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.11.185
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author D. S. Campbell
R. B. Pranchov
author_facet D. S. Campbell
R. B. Pranchov
author_sort D. S. Campbell
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institution Kabale University
issn 0882-7516
1563-5031
language English
publishDate 1984-01-01
publisher Wiley
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series Active and Passive Electronic Components
spelling doaj-art-016aa05d17cb4dd684fcf24bf125757a2025-08-20T03:55:27ZengWileyActive and Passive Electronic Components0882-75161563-50311984-01-0111218519010.1155/APEC.11.185Model for Reliability Prediction of Thick Film ResistorsD. S. CampbellR. B. Pranchovhttp://dx.doi.org/10.1155/APEC.11.185
spellingShingle D. S. Campbell
R. B. Pranchov
Model for Reliability Prediction of Thick Film Resistors
Active and Passive Electronic Components
title Model for Reliability Prediction of Thick Film Resistors
title_full Model for Reliability Prediction of Thick Film Resistors
title_fullStr Model for Reliability Prediction of Thick Film Resistors
title_full_unstemmed Model for Reliability Prediction of Thick Film Resistors
title_short Model for Reliability Prediction of Thick Film Resistors
title_sort model for reliability prediction of thick film resistors
url http://dx.doi.org/10.1155/APEC.11.185
work_keys_str_mv AT dscampbell modelforreliabilitypredictionofthickfilmresistors
AT rbpranchov modelforreliabilitypredictionofthickfilmresistors