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    Current induced electromechanical strain in thin antipolar Ag2Se semiconductor

    Current induced electromechanical strain in thin antipolar Ag2Se semiconductor by Hao Luo, Qi Liang, Anan Guo, Yimeng Yu, Haoyang Peng, Xiaoyi Gao, Yihao Hu, Xianli Su, Ctirad Uher, Yu Zheng, Dongwang Yang, Xiaolin Wang, Qingjie Zhang, Xinfeng Tang, Shi Liu, Gustaaf Van Tendeloo, Shujun Zhang, Jinsong Wu

    Published 2025-02-01
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