Enabling atomic resolution electron microscopy at elevated temperature and beyond pressures of a few bar by Ambjørner Hjalte, Bjørnlund Anton, Bonczyk Tobias, Dollekamp Edwin, Kaas Lau, Colding-Fagerholt Sofie, Mølhave Kristian, Damsgaard Christian, Helveg Stig, Vesborg Peter

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Imaging Atomic Processes in Catalysts using a New High-Order Imaged-Corrected Environmental-TEM by Biran Idan, Villoro Ruben Bueno, Kisielowski Christian, Vesborg Peter Christian Kjærgaard, Wirix Maarten, Cats Dennis, Shastri Narasimha, Haasnoot Wessel, Kibsgaard Jakob, Bligaard Thomas, Damsgaard Christian Danvad, Jinschek Joerg, Helveg Stig

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