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    Comparative Simulation Analysis of Process Parameter Variations in 20 nm Triangular FinFET

    Comparative Simulation Analysis of Process Parameter Variations in 20 nm Triangular FinFET by Satyam Shukla, Sandeep Singh Gill, Navneet Kaur, H. S. Jatana, Varun Nehru

    Published 2017-01-01
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