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    Conductive filament formation in the failure of Hf0.5Zr0.5O2 ferroelectric capacitors

    Conductive filament formation in the failure of Hf0.5Zr0.5O2 ferroelectric capacitors by Matthew Webb, Tony Chiang, Megan K. Lenox, Jordan Gray, Tao Ma, Jon F. Ihlefeld, John T. Heron

    Published 2025-01-01
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