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    Hot Carrier Degradation in Si n-MOSFETs at Cryogenic Temperatures

    Hot Carrier Degradation in Si n-MOSFETs at Cryogenic Temperatures by Shunsuke Shitakata, Hiroshi Oka, Kimihiko Kato, Takumi Inaba, Shota Iizuka, Hidehiro Asai, Takahiro Mori

    Published 2025-01-01
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