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    Gate driver-in-panel circuit using low-temperature polycrystalline silicon and oxide TFTs with mitigated positive bias temperature stress

    Gate driver-in-panel circuit using low-temperature polycrystalline silicon and oxide TFTs with mitigated positive bias temperature stress by Se Hwan Na, Seok Gyu Hong, Yong Seon Hwang, Jung Chul Kim, Juhn Suk Yoo, Hyun Jae Kim

    Published 2025-06-01
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