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YOLO-SUMAS: Improved Printed Circuit Board Defect Detection and Identification Research Based on YOLOv8 by Ying Tang, Runhao Liu, Sheng Wang
Published 2025-04-01Get full text
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Large Language Model-Powered Protected Interface Evasion: Automated Discovery of Broken Access Control Vulnerabilities in Internet of Things Devices by Enze Wang, Wei Xie, Shuhuan Li, Runhao Liu, Yuan Zhou, Zhenhua Wang, Shuoyoucheng Ma, Wantong Yang, Baosheng Wang
Published 2025-05-01Get full text
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