Showing 1 - 1 results of 1 for search 'Roy A. C. van Zuijlen', query time: 0.01s Refine Results
  1. 1
    Calibration of Electron Microscopes Through Deep Learning and Bayesian Optimization

    Calibration of Electron Microscopes Through Deep Learning and Bayesian Optimization by Jilles S. van Hulst, Roy A. C. van Zuijlen, Narges Javaheri, Maurits Diephuis, Duarte J. Antunes, W. P. M. H. Heemels

    Published 2025-01-01
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: