Photoelectrochemical Characterization of Sprayed α-Fe2O3 Thin Films: Influence of Si Doping and SnO2 Interfacial Layer by Yongqi Liang, Cristina S. Enache, Roel van de Krol

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Chemical Treatment of Sn‐Containing Transparent Conducting Oxides for the Enhanced Adhesion and Thermal Stability of Electroplated Metals by Ibbi Y. Ahmet, Fatwa F. Abdi, Roel van de Krol

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Generalized Method to Extract Carrier Diffusion Length from Photoconductivity Transients: Cases of BiVO_{4}, Halide Perovskites, and Amorphous and Crystalline Silicon by Markus Schleuning, Moritz Kölbach, Fatwa F. Abdi, Klaus Schwarzburg, Martin Stolterfoht, Rainer Eichberger, Roel van de Krol, Dennis Friedrich, Hannes Hempel

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Resolving Peak Overlap in HPLC Analysis of Glycerol Oxidation Products by Utilizing Various Detectors: Application to BiVO4 Photoanodes by Heejung Kong, Siddharth Gupta, Matthew T. Mayer, Eva Ng, Camilo A. Mesa, Sixto Giménez, Fatwa F. Abdi, Roel van de Krol, Marco Favaro

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Estimating the quasi-Fermi level of holes at the surface of semiconductor photoanodes using outer-sphere redox couples by Yuu Shioiri, Keisuke Obata, Yudai Kawase, Tomohiro Higashi, Masao Katayama, Markus Schleuning, Roel van de Krol, Dennis Friedrich, Fatwa Firdaus Abdi, Kazuhiro Takanabe

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Ultrafast Electron Dynamics at the Water‐Modified InP(100) Surface by Jonathan Diederich, Agnieszka Paszuk, Isaac Azahel Ruiz Alvarado, Marvin Krenz, Mohammad Amin Zare Pour, Diwakar Suresh Babu, Jennifer Velazquez Rojas, Christian Höhn, Yuying Gao, Klaus Schwarzburg, David Ostheimer, Rainer Eichberger, Wolf Gero Schmidt, Thomas Hannappel, Roel van deKrol, Dennis Friedrich

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