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Deep Learning Automated System for Thermal Defectometry of Multilayer Materials by A. S. Momot, R. M. Galagan, V. Yu. Gluhovskii
Published 2021-06-01
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Smartphone-Based Automated Non-Destructive Testing Devices by V. F. Petryk, A. G. Protasov, R. M. Galagan, A. V. Muraviov, I. I. Lysenko
Published 2020-12-01
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