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    Neural‐Network Potential for Defect Formation Induced by Knock‐On Irradiation Damage in 4H‐SiC

    Neural‐Network Potential for Defect Formation Induced by Knock‐On Irradiation Damage in 4H‐SiC by Wei Liu, Pengsheng Guo, Ziyue Zheng, Shiyou Chen, Yu‐Ning Wu

    Published 2025-07-01
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