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  1. 1
    Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor

    Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor by N. Toufik, F. Pélanchon, P. Mialhe

    Published 2001-01-01
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  2. 2
    Diode Parameter Determination Applied to LDD-MOSFETs for Device Characterization

    Diode Parameter Determination Applied to LDD-MOSFETs for Device Characterization by M. De La Bardonnie, P. Mialhe, E. Bendada, E. Blampain, A. Hoffmann, J.-P. Charles

    Published 1998-01-01
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