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Analysis of Standards-Based Counterfeit Microelectronics Detection Methods by Devon R. Richman, Michael H. Azarian, Diganta Das, Michael Pecht

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Translation Invariance-Based Deep Learning for Rotating Machinery Diagnosis by Wenliao Du, Shuangyuan Wang, Xiaoyun Gong, Hongchao Wang, Xingyan Yao, Michael Pecht

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Reliability and safety of elevators and escalators/ travelators: Past, present and future by Ping Kwan Man, Chak-Nam Wong, Wai Kit Chan, Hiu Hung Lee, Jingyuan Huang, Michael Pecht

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