Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements by Kobe De Geest, Enes Lievens, Ewout Picavet, Klaartje De Buysser, Dries Van Thourhout, Jeroen Beeckman

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A Pathway for the Integration of Novel Ferroelectric Thin Films on Non-Planar Photonic Integrated Circuits by Enes Lievens, Kobe De Geest, Ewout Picavet, Liesbet Van Landschoot, Henk Vrielinck, Gilles Freddy Feutmba, Hannes Rijckaert, Klaartje De Buysser, Dries Van Thourhout, Peter Bienstman, Jeroen Beeckman

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