Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence by Shunta Harada, Yasutaka Matsubara, Shohei Hayashi, Michio Kawase, Keisuke Seo, Seiya Mizutani, Yuya Mizutani, Seiji Mizutani, Kenta Murayama

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