Temperature-Dependent Electrical Characteristics and Low-Frequency Noise Analysis of AlGaN/GaN HEMTs by Qiang Chen, Y. Q. Chen, Chang Liu, Zhiyuan He, Yuan Chen, K. W. Geng, Y. J. He, W. Y. Chen

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Trap Analysis Based on Low-Frequency Noise for SiC Power MOSFETs Under Repetitive Short-Circuit Stress by J. L. Wang, Y. Q. Chen, J. T. Feng, X. B. Xu, Y. F. En, B. Hou, R. Gao, Y. Chen, Y. Huang, K. W. Geng

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