DESIGN OF THE CONTACT POTENTIALS DIFFERENCE PROBES by K. U. Pantsialeyeu, U. A. Mikitsevich, A. L. Zharin

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Universal Digital Probe Electrometer for Testing Semiconductor Wafers by A. L. Zharin, U. A. Mikitsevich, A. I. Svistun, K. U. Pantsialeyeu

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DIGITAL CONTACT POTENTIAL DIFFERENCE PROBE by K. U. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, A. L. Zharin

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Intelligent Sensor for Measurement Systems with Sinusoidal Excitation Response by U. A. Mikitsevich, A. I. Svistun, A. V. Samarina, K. U. Pantsialeyeu, A. L. Zharin

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ANALYSIS OF SURFACE DEFECTS OF ALUMINUM AND ITS ALLOYS WITH A SCANNING KELVIN PROBE by A. K. Tyavlovsky, A. L. Zharin, O. K. Gusev, R. I. Varabei, N. I. Muhurov, G. V. Sharonov, K. U. Pantsialeyeu

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Surface Electric Potential Measurement with a Static Probe by R. I. Vorobey, O. K. Gusev, A. I. Zharin, V. A. Mikitsevich, K. U. Pantsialeyeu, A. V. Samarina, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky

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