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  1. 1
    In-Situ Nanoindentation Surface Topography of Lead-Free Piezoelectric Thin Films

    In-Situ Nanoindentation Surface Topography of Lead-Free Piezoelectric Thin Films by Maxence Bigerelle, Julie Lemesle, Alex Montagne, Denis Remiens

    Published 2024-12-01
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  2. 2
    A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators

    A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators by Clément Moreau, Julie Lemesle, David Páez Margarit, François Blateyron, Maxence Bigerelle

    Published 2024-11-01
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