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    Enhanced DET-Based Fault Signature Analysis for Reliable Diagnosis of Single and Multiple-Combined Bearing Defects

    Enhanced DET-Based Fault Signature Analysis for Reliable Diagnosis of Single and Multiple-Combined Bearing Defects by In-Kyu Jeong, Myeongsu Kang, Jaeyoung Kim, Jong-Myon Kim, Jeong-Min Ha, Byeong-Keun Choi

    Published 2015-01-01
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