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  1. 1
    20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates

    20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates by T. Ziegelwanger, M. Reisinger, B. Vedad, K. Hlushko, S. Van Petegem, J. Todt, M. Meindlhumer, J. Keckes

    Published 2025-03-01
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  2. 2
    Intragranular strain and mosaicity in Cu thin films during fast thermomechanical fatigue

    Intragranular strain and mosaicity in Cu thin films during fast thermomechanical fatigue by T. Ziegelwanger, M. Reisinger, M. Petersmann, S. Van Petegem, R. Rodriguez-Lamas, J. Todt, M. Meindlhumer, J. Keckes, C. Yildirim

    Published 2025-07-01
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