Noncontact Monitoring and Imaging of the Operation and Performance of Thin‐Film Field‐Effect Transistors by Kwangsik Jeong, Dong yeob Shin, Ji‐Min Park, Dong‐Joon Yi, Hyunmin Hong, Hyun‐Suk Kim, Kwun‐Bum Chung

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High-Mobility Tellurium Thin-Film Transistor: Oxygen Scavenger Effect Induced by a Metal-Capping Layer by Seung-Min Lee, Seong Cheol Jang, Ji-Min Park, Jaewon Park, Nayoung Choi, Kwun-Bum Chung, Jung Woo Lee, Hyun-Suk Kim

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