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    Charge trapping in SiO2 substrate during electron beam deposition of CaF2 thin films of different thicknesses

    Charge trapping in SiO2 substrate during electron beam deposition of CaF2 thin films of different thicknesses by Marina Romanova, Sergii Chertopalov, Yuri Dekhtyar, Ladislav Fekete, Ján Lančok, Michal Novotný, Petr Pokorný, Anatoli I. Popov, Hermanis Sorokins, Aleksandr Vilken

    Published 2025-02-01
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