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    DAM-Faster RCNN: few-shot defect detection method for wood based on dual attention mechanism

    DAM-Faster RCNN: few-shot defect detection method for wood based on dual attention mechanism by Xingyu Tong, Zhihong Liang, Mingming Qin, Fangrong Liu, Jiayu Yang, Hengjiang Xiao, Wei Dai

    Published 2025-07-01
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