Micrometric and Nanometric Characterization of Rock Aggregates Using AIMS, AFM, and SEM to Further Discussions on Geotechnical Roughness Classification Systems by Haline Dugolin Ceccato, Augusto Gonçalves Nobre, Andréa Valli Nummer, Rinaldo José Barbosa Pinheiro, Ricardo Barreto da Silva, Josué Neroti Rigue

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