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  1. 1
    Surface State Capture Cross-Section at the Interface between Silicon and Hafnium Oxide

    Surface State Capture Cross-Section at the Interface between Silicon and Hafnium Oxide by Fu-Chien Chiu

    Published 2013-01-01
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  2. 2
    A Substrate-and-Gate Triggering NMOS Device for High ESD Reliability in Deep Submicrometer Technology

    A Substrate-and-Gate Triggering NMOS Device for High ESD Reliability in Deep Submicrometer Technology by Chih-Yao Huang, Fu-Chien Chiu

    Published 2013-01-01
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