An Effective Method to Compensate for Testing Induced SBFET Degradation by Charging Deep-Level Interface Trap by Tiexin Zhang, Fanyu Liu, Lei Shu, Siyuan Chen, Yuchong Wang, Yuchen Wu, Jing Wan, Yong Xu, Shi Li, Yuyang Ding, Bo Li, Zhengsheng Han, Tianchun Ye

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