Showing 1 - 4 results of 4 for search 'F. Pelanchon', query time: 0.01s Refine Results
  1. 1
    Degradation of VDMOSFET by Heavy Ion Irradiations

    Degradation of VDMOSFET by Heavy Ion Irradiations by C. Salame, F. Pelanchon, P. Mialhe

    Published 2000-01-01
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  2. 2
    A New Junction Parameters Determination Using the Double Exponential Model

    A New Junction Parameters Determination Using the Double Exponential Model by S. Dib, A. Khoury, F. PéLanchon, P. Mialhe

    Published 2002-01-01
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  3. 3
    Junction Parameter Extraction for Electronic Device Characterization

    Junction Parameter Extraction for Electronic Device Characterization by S. Dib, C. Salame, N. Toufik, A. Khoury, F. Pélanchon, P. Mialhe

    Published 2004-01-01
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  4. 4
    A New Method for the Extraction of Diode Parameters Using a Single Exponential Model

    A New Method for the Extraction of Diode Parameters Using a Single Exponential Model by S. Dib, M. De La Bardonnie, A. Khoury, F. Pelanchon, P. Mialhe

    Published 2000-01-01
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