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    Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements

    Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements by Kobe De Geest, Enes Lievens, Ewout Picavet, Klaartje De Buysser, Dries Van Thourhout, Jeroen Beeckman

    Published 2025-01-01
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