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    Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional <span style="font-variant: small-caps">nand</span> Flash Memories

    Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional <span style="font-variant: small-caps">nand</span> Flash Memories by David G. Refaldi, Gerardo Malavena, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni

    Published 2024-12-01
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