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Solution Shearing of Sustainable Aluminum Oxide Thin Films for Compliance‐Free, Voltage‐Regulated Multi‐Bit Memristors by Preetam Dacha, Anju Kumari R, Darius Pohl, Angelika Wrzesińska‐Lashkova, Alexander Tahn, Bernd Rellinghaus, Yana Vaynzof, Stefan C. B. Mannsfeld
Published 2025-05-01Get full text
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