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  1. 1
    Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional <span style="font-variant: small-caps">nand</span> Flash Memories

    Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional <span style="font-variant: small-caps">nand</span> Flash Memories by David G. Refaldi, Gerardo Malavena, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni

    Published 2024-12-01
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  2. 2
    Discrete-Trap Effects on 3-D NAND Variability &#x2013; Part II: Random Telegraph Noise

    Discrete-Trap Effects on 3-D NAND Variability &#x2013; Part II: Random Telegraph Noise by Gerardo Malavena, Salvatore M. Amoroso, Andrew R. Brown, Plamen Asenov, Xi-Wei Lin, Victor Moroz, Mattia Giulianini, David Refaldi, Christian Monzio Compagnoni, Alessandro S. Spinelli

    Published 2024-01-01
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