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    Inversion of the Internal Electric Field in GaN/AlN Heterostructures Studied by Off-Axis Electron Holography

    Inversion of the Internal Electric Field in GaN/AlN Heterostructures Studied by Off-Axis Electron Holography by Denaix Lou, Castioni Florian, Bryan Matthew, Cooper David, Monroy Eva

    Published 2024-01-01
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  2. 2
    Robustness evaluation of electric field measurements via template matching in 4D-STEM

    Robustness evaluation of electric field measurements via template matching in 4D-STEM by Wartelle Alexis, Bryan Matthew, Lu Yiran, Cooper David, Rouvière Jean-Luc, den Hertog Martien

    Published 2024-01-01
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