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    Enabling atomic resolution electron microscopy at elevated temperature and beyond pressures of a few bar

    Enabling atomic resolution electron microscopy at elevated temperature and beyond pressures of a few bar by Ambjørner Hjalte, Bjørnlund Anton, Bonczyk Tobias, Dollekamp Edwin, Kaas Lau, Colding-Fagerholt Sofie, Mølhave Kristian, Damsgaard Christian, Helveg Stig, Vesborg Peter

    Published 2024-01-01
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