Showing 1 - 8 results of 8 for search 'A. I. Blesman', query time: 0.02s Refine Results
  1. 1
    Vacuum vaporizer for fabrication of thin films of material by sublimations

    Vacuum vaporizer for fabrication of thin films of material by sublimations by A. I. Blesman, R. B. Burlakov

    Published 2019-12-01
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  2. 2
    Photocells based on silicide Schottky barrier contacts PtSi-n-Si and PdSi-n-Si

    Photocells based on silicide Schottky barrier contacts PtSi-n-Si and PdSi-n-Si by A. I. Blesman, R. B. Burlakov

    Published 2019-03-01
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  3. 3
    Probe device for electrical measurements of parameters thin doped films ZnO

    Probe device for electrical measurements of parameters thin doped films ZnO by A. I. Blesman, R. B. Burlakov

    Published 2020-03-01
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  4. 4
    Electrical and photoelectric properties of photocell on base of Schottky barrier contact Au-n-GaAs

    Electrical and photoelectric properties of photocell on base of Schottky barrier contact Au-n-GaAs by A. I. Blesman, R. B. Burlakov

    Published 2019-10-01
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  5. 5
    Influence of terms of fabrication on electrical and photoelectric properties of photocell on base of Schottky barrier contact Pd-n-GaAs

    Influence of terms of fabrication on electrical and photoelectric properties of photocell on base of Schottky barrier contact Pd-n-GaAs by A. I. Blesman, R. B. Burlakov

    Published 2019-06-01
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  6. 6
    Electrical and photoelectric properties of photocell based on two Schottky barrier contacts Al-p-Si and Ti-p-Si

    Electrical and photoelectric properties of photocell based on two Schottky barrier contacts Al-p-Si and Ti-p-Si by A. I. Blesman, R. B. Burlakov, D. A. Polonyankin

    Published 2019-10-01
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  7. 7
    Investigation of wire electrical discharge machining modes influences on crack formation and surface layer morphology of the Ti-6Al-2.5Mo-2Cr-0.3Si titanium alloy

    Investigation of wire electrical discharge machining modes influences on crack formation and surface layer morphology of the Ti-6Al-2.5Mo-2Cr-0.3Si titanium alloy by A. A. Fedorov, D. A. Polonyankin, A. I. Blesman, N. V. Bobkov, A. V. Linovsky, Iu. O. Bredgauer, Yu. E. Zhdanova

    Published 2020-04-01
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  8. 8
    New materials based on InP-ZnS system for semiconductor gas analyzers

    New materials based on InP-ZnS system for semiconductor gas analyzers by I. A. Kirovskaya, R. V. Ekkert, A. O. Ekkert, E. V. Mironova, I. Yu. Umansky, A. I. Blesman, D. A. Polonyankin, L. V. Kolesnikov, E. N. Kopylova, V. B. Goncharov

    Published 2019-04-01
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