The Effects of Process Conditions on Reliability of Silicon Nanowires
Material reliability is among the crucial factors that impact the performance of devices. In order to predict material reliability, an accelerated ageing study to predict material shelf life when subjected to temperature and humidity was performed on silicon nanowires (SiNWs). We investigated the ef...
Saved in:
| Main Authors: | Uchechukwu C. Wejinya, Nathan Willems, Zhuxin Dong, Mojtaba Abolhassani |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
2016-06-01
|
| Series: | Nanomaterials and Nanotechnology |
| Subjects: | |
| Online Access: | http://www.intechopen.com/journals/nanomaterials_and_nanotechnology/the-effects-of-process-conditions-on-reliability-of-silicon-nanowires |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
High‐Performance Flexible Silicon Nanowire Field Effect Transistors on Plastic Substrates
by: Ting Zhang, et al.
Published: (2025-04-01) -
Direct Synthesis of α-Silicon Nitride Nanowires from Silicon Monoxide on Alumina
by: Jiang Cui, et al.
Published: (2015-10-01) -
Understanding intrinsic stress effects on vibrational response of silicon nanowires
by: Sina Zare Pakzad, et al.
Published: (2024-12-01) -
Infrared photodetectors based on InAsP epitaxial nanowires on silicon
by: Goltaev Aleksandr, et al.
Published: (2025-06-01) -
Porous silicon nanowire arrays fabrication through one-step metal-assisted chemical etching
by: HE Zu-dong, et al.
Published: (2019-07-01)