Enhanced cross-interfacial growth by thickening transition layers and tailoring grain size of columnar nanotwinned Cu films

Electrodeposited <111>-oriented nanotwinned Cu (NT-Cu) films consist of micron-scale columnar grains and they are thermally stable up to 400 °C. By adding nanoscale equiaxed Cu grains at the bottom of the NT-Cu films, anisotropic large grain growth could be triggered below 200 °C. The grains g...

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Bibliographic Details
Main Authors: Kuan-Ju Chen, Chang-Chih Hsieh, Dinh-Phuc Tran, Chih Chen
Format: Article
Language:English
Published: Elsevier 2024-11-01
Series:Journal of Materials Research and Technology
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785424022440
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