Possibility of Application of Topological Consideration for Grain Boundaries in Nanosilicon Films
A comparative analysis of the experimentally observed by atomic force microscopy grain boundary structure of nanosilicon films with the existing model representations was carried out. It is shown that the topological model of structural changes may be used for the analysis of changes of grain bounda...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2016-12-01
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| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2016/4/articles/jnep_2016_V8_04084.pdf |
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