Recent Advances in In Situ 3D Surface Topographical Monitoring for Additive Manufacturing Processes
Additive manufacturing (AM) has revolutionized production across industries, yet persistent challenges in defect detection and process reliability necessitate advanced in situ monitoring solutions. While non-destructive evaluation (NDE) techniques such as X-ray computed tomography, thermography, and...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-04-01
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| Series: | Journal of Manufacturing and Materials Processing |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2504-4494/9/4/133 |
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