Understanding the Slow Erase Operation in IGZO-Channel FeFETs: The Role of Positive Charge Generation Kinetics by Zhuo Chen, Nicolo Ronchi, Roman Izmailov, Hongwei Tang, Mihaela Ioana Popovici, Harold Dekkers, Alexandru Pavel, Geert Van den Bosch, Maarten Rosmeulen, Valeri V. Afanas'Ev, Jan Van Houdt

Get full text